Could an open-source approach to test systems help the embedded systems industry?

Fast facts

• Internal authorship

  Prof. Dr. Carsten Alexander Wolff

• Further publishers

  Peter Schulz, Noura Sleibi, Christian Hensen

• Publishment

  • 2024
  • Volume 2024 IEEE AUTOTESTCON

• Organizational unit

  IDiAL

• Subjects

  • Computer science in general

• Publication format

  Conference paper