Zitat
P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” in 2019 IEEE AUTOTESTCON, 2019, pp. 1–5.
Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry
Schnelle Fakten
Interne Autorenschaft
Weitere Publizierende
Peter Schulz
Veröffentlichung
- 2019
Sammelband
Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry (2019 IEEE AUTOTESTCON)
Organisationseinheit
Fachgebiete
- Informatik allgemein
Format
Konferenzpaper